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XSemetro
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XSemetro

XSemetro

September 25-27, 2013


NCSLI Measure

Some selected papers presented at the conference will also be published in a special issue of the NCSLI Measure: The Journal of Measurement Science.

 

Invited speakers

The conference will offer plenary presentations given by invited speakers. Find more information at Technical Program.

Scope


The International Congress on Electrical Metrology -SEMETRO- is devoted to topics related to electromagnetic measurements. This conference covers high accuracy and industrial measurements in the frequency range from DC to the optical region. The main types of organizations which will participate in the X SEMETRO are national metrology institutes, industrial organizations which manufacture electrical standards and measuring instruments, industrial and government standards laboratories and universities which conduct research on precision measurements, standards and related fundamental constants. The X SEMETRO will be the first to be held outside Brazil, in Buenos Aires – Argentina – September 2013, thus confirming the international character of SEMETRO. It will be organized by the Instituto Nacional de Tecnología Industrial (INTI) of Argentina and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO) of Brazil.

Topics


Item Metrology and Instrumentation.
Item Quality management in testing and calibration laboratories.
Item Standards, calibration, techniques, methods and measurement procedures.
Item Software, automation and data validation in electrical metrology.
Item Traceability, international compatibility of measurements.
Item Quantum metrology and fundamental constants.
Item Time and frequency measurements.
Item Measurements in the frequency range from DC to the optical region.
Item Remote calibration and measurement systems.
Item New technologies applied to electrical metrology.
Item Electrical metrology in the areas of health, environment and telecommunications.

 


Item Mathematical and statistical tools for metrology.
Item Digital signal processing.
Item Waveform analysis and measurement.
Item EMC measurements.
Item Power and energy measurements.

Item Power quality assessment.
Item Measurement of system identification and control.
Item Analysis and modeling of measurement systems.
Item Smart Grids.
Item Measurement of electrical quantities.
Item Education in instrumentation and measurement.
Item Sensors and transducers.
Item A/D and D/A converters.
Item Biomedical instrumentation.
Item Advanced instrumentation based on micro- and nano-technologies.